Hou, Hongyu, The School of Management, Xi'an Jiaotong University, China

• International Journal of Industrial Engineering: Theory, Applications and Practice Vol. 27 No. 5 (2020): Special Issue: Data-Driven Computational Intelligence in Industry Application - Special Issue on Data-driven Computational Intelligence in Industries Application
  AUTOMATED DEFECT INSPECTION ALGORITHM FOR SEMICONDUCTOR-PACKAGED CHIPS
  Abstract