Lee, Heejung, Hanyang University, Korea, Republic of
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International Journal of Industrial Engineering: Theory, Applications and Practice Vol. 26 No. 1 (2019): 2016 Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling at Seoul, Korea - 2016 Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling
PREDICTION OF TIMES-TO-FAILURE OF SEMICONDUCTOR CHIPS USING VMIN DATA
Abstract