Mun BM, Lee C, Bae SJ, Jang S- gyo, Ryu BT. A Bayesian Approach for Predicting Functional Reliability of One-Shot Devices. Int J Ind Eng [Internet]. 2019 Mar. 23 [cited 2024 May 5];26(1). Available from: https://journals.sfu.ca/ijietap/index.php/ijie/article/view/3638