Lee, Heejung, and Dong-Hee Lee. “PREDICTION OF TIMES-TO-FAILURE OF SEMICONDUCTOR CHIPS USING VMIN DATA”. International Journal of Industrial Engineering: Theory, Applications and Practice 26, no. 1 (March 23, 2019). Accessed May 21, 2024. https://journals.sfu.ca/ijietap/index.php/ijie/article/view/3574.