YANG, T.-H.; LIN, I.-C.; HUANG, C.-F. A Decision Support System for Wafer Probe Card Production Scheduling. International Journal of Industrial Engineering: Theory, Applications and Practice, [S. l.], v. 27, n. 1, 2020. DOI: 10.23055/ijietap.2020.27.1.4821. Disponível em: https://journals.sfu.ca/ijietap/index.php/ijie/article/view/4821. Acesso em: 27 apr. 2024.