ZHANG, S.; BAE, H.; KOO, H. EFFICIENT VALIDATION OF RFID COMPLEX EVENTS CONSIDERING BUSINESS PROCESS STRUCTURE. International Journal of Industrial Engineering: Theory, Applications and Practice, [S. l.], v. 18, n. 12, 2011. DOI: 10.23055/ijietap.2011.18.12.467. Disponível em: https://journals.sfu.ca/ijietap/index.php/ijie/article/view/467. Acesso em: 16 may. 2024.