MUN, B. M.; LEE, C.; BAE, S. J.; JANG, S.- gyo; RYU, B. T. A Bayesian Approach for Predicting Functional Reliability of One-Shot Devices. International Journal of Industrial Engineering: Theory, Applications and Practice, [S. l.], v. 26, n. 1, 2019. DOI: 10.23055/ijietap.2019.26.1.3638. Disponível em: https://journals.sfu.ca/ijietap/index.php/ijie/article/view/3638. Acesso em: 5 may. 2024.