LEE, H.; LEE, D.-H. PREDICTION OF TIMES-TO-FAILURE OF SEMICONDUCTOR CHIPS USING VMIN DATA. International Journal of Industrial Engineering: Theory, Applications and Practice, [S. l.], v. 26, n. 1, 2019. DOI: 10.23055/ijietap.2019.26.1.3574. Disponível em: https://journals.sfu.ca/ijietap/index.php/ijie/article/view/3574. Acesso em: 21 may. 2024.