ZERNIG, A.; BLUDER, O.; PILZ, J.; KÄSTNER, A.; KRAUTH, A. IDENTIFICATION OF RISK DEVICES USING INDEPENDENT COMPONENT ANALYSIS FOR SEMICONDUCTOR MEASUREMENT DATA. International Journal of Industrial Engineering: Theory, Applications and Practice, [S. l.], v. 23, n. 5, 2017. DOI: 10.23055/ijietap.2016.23.5.2852. Disponível em: https://journals.sfu.ca/ijietap/index.php/ijie/article/view/2852. Acesso em: 16 may. 2024.