Mun, B. M., Lee, C., Bae, S. J., Jang, S.- gyo, & Ryu, B. T. (2019). A Bayesian Approach for Predicting Functional Reliability of One-Shot Devices. International Journal of Industrial Engineering: Theory, Applications and Practice, 26(1). https://doi.org/10.23055/ijietap.2019.26.1.3638